Fourier Lucas-Kanade Algorithm - Robotics Institute Carnegie Mellon University

Fourier Lucas-Kanade Algorithm

Simon Lucey, Rajitha Navarathna, Ahmed Bilal Ashraf, and Sridha Sridharan
Journal Article, IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 35, No. 6, pp. 1383 - 1396, June, 2013

Abstract

In this paper we propose a framework for both gradient descent image and object alignment in the Fourier domain. Our method centers upon the classical Lucas & Kanade (LK) algorithm where we represent the source and template/model in the complex 2D Fourier domain rather than in the spatial 2D domain. We refer to our approach as the Fourier LK (FLK) algorithm. The FLK formulation is advantageous when one pre-processes the source image and template/model with a bank of filters (e.g. oriented edges, Gabor, etc.) as: (i) it can handle substantial illumination variations, (ii) the inefficient pre-processing filter bank step can be subsumed within the FLK algorithm as a sparse diagonal weighting matrix, (iii) unlike traditional LK the computational cost is invariant to the number of filters and as a result far more efficient, and (iv) this approach can be extended to the inverse compositional form of the LK algorithm where nearly all steps (including Fourier transform and filter bank pre-processing) can be pre-computed leading to an extremely efficient and robust approach to gradient descent image matching. Further, these computational savings translate to non-rigid object alignment tasks that are considered extensions of the LK algorithm such as those found in Active Appearance Models (AAMs).

BibTeX

@article{Lucey-2013-17099,
author = {Simon Lucey and Rajitha Navarathna and Ahmed Bilal Ashraf and Sridha Sridharan},
title = {Fourier Lucas-Kanade Algorithm},
journal = {IEEE Transactions on Pattern Analysis and Machine Intelligence},
year = {2013},
month = {June},
volume = {35},
number = {6},
pages = {1383 - 1396},
keywords = {Lucas & Kanade (LK), Fourier Domain, Illumination Invariance, Active Appearance Model (AAM)},
}