IMS Technical Committee TC-22: Intelligent Measurement Systems
Magazine Article, IEEE Instrumentation & Measurement Magazine, Vol. 24, No. 8, pp. 14 - 17, November, 2021
Abstract
This article provides an overview of the IEEE Instrumentation and Measurement Society Technical Committee TC-22 on Intelligent Measurement Systems (https://ieee-ims.org/technical-committee/tc-22). The scope of the TC-22 is related to fostering development and use of artificial intelligence, computational intelligence, and soft computing in measurement systems and related applications.
BibTeX
@periodical{Genovese-2021-130406,author = {Angelo Genovese and Mel Siegel},
title = {IMS Technical Committee TC-22: Intelligent Measurement Systems},
journal = {IEEE Instrumentation & Measurement Magazine},
year = {2021},
month = {November},
pages = {14 - 17},
volume = {24},
}
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